Texas Instruments Incorporated (TI) (NASDAQ: TXN) today introduced a low-side gate driver for use with MOSFETs and Gallium-Nitride (GaN) power field-effect transistors (FETs) in high-density power converters. The new LM5114 drives GaN FETs and MOSFETs in low-side applications, such as synchronous rectifiers and power factor converters. Together with the LM5113, the industry's first 100-V half-bridge GaN FET driver announced in 2011, the family provides a complete isolated DC/DC conversion driver solution for high-power GaN FETs and MOSFETs used in high-performance telecom, networking and data centre applications. For more information, samples and an evaluation board, visit www.ti.com/gan-pr. The LM5114 drives both standard MOSFETs and GaN FETs by using independent sink and source outputs from a 5-V supply voltage. It features a high 7.6-A check that release has gone live on this site http://newscenter.ti.com/?DCMP=TIFooterTracking&HQS=Other+OT+footer_presspeak turn-off current capability needed in high-power applications where larger or paralleled FETs are used. The increased pull-down strength also enables it to drive GaN FETs properly. The independent source and sink outputs eliminate the need for a diode in the driver path and allows tight control of the rise and fall times. TI is showcasing its FET driver family -- the LM5114, the LM5113 in a new micro SMD package, the pin compatible 4-A/8-A UCC27511 low-side gate driver scheduled for release in March, and other products that help unlock the full benefits of GaN FET technology -- in booth #401 at the Applied Power Electronics Conference and Expo (APEC) in Orlando, Florida, Feb. 6-8. APEC is one of the industry's leading conferences for practicing power electronics professionals. Key features and benefits of the LM5114 low-side gate driver