IAR Systems has launched a complete integration of JTAGjet-Trace into the development tool suite IAR Embedded Workbench for ARM. Thanks to the new full integration, IAR Embedded Workbench users gain access to advanced trace support for all ARM cores and can take full advantage of the trace capabilities on ARM Cortex-M, Cortex-R and Cortex-A devices in addition to ARM7, ARM 9, and ARM11 when debugging complex systems. JTAGjet-Trace is an in-circuit debugging probe with advanced trace features for complex application development. With support for ETM (embedded trace macrocell), it provides developers with complete insight into their application's behavior. Users can observe the effect of the program as it executes on the board and use techniques such as full instruction trace and function profiling to identify problems in the application. JTAGjet-Trace is based on the JTAG boundary scan port and can perform trace acquisition of up to 200 MHz trace clock (400 Msps ETM trace acquisition speed) with a trace-buffer capture capacity of up to 18 MB. Auto-adjusting timing eliminates problems with data and clock skew, and 56-bit time stamping provides CPU cycle accuracy down to 5 ns. IAR Embedded Workbench now also supports simultaneously connecting multiple SWD (serial wire debug) devices. This considerably simplifies debugging of ARM Cortex multicore devices. By connecting to multiple cores on the same device at the same time, the complete multicore application can be concurrently debugged. "The demand for extended debugging and trace possibilities is high," confirmed Mats Ullström, Director of Products and Services, IAR Systems. "With the integration of JTAGjet-Trace, we offer expanded trace functionality, and continue to supply our existing and new customers with high-quality, well-integrated tools. By combining the advanced debugging functionality in IAR Embedded Workbench with JTAGjet-Trace, users gain new possibilities for powerful debugging with trace." IAR Embedded Workbench is a complete C/C++ development tool suite for embedded applications, including high-performing build tools and the comprehensive IAR C-SPY Debugger. Recognizing the importance of providing simplified, seamless development workflows, IAR Systems purchased Signum Systems in 2011 and now offers a product portfolio of completely integrated in-circuit debugging probes. In addition to JTAGjet-Trace, the portfolio includes I-jet, which offers full power profiling for all ARM cores. IAR Systems delivers all products with access to the company's extensive technical support. JTAGjet-Trace is available in a specific ARM Cortex-M edition, as well as a full edition with support for all ARM7, ARM9, ARM11, Cortex-M, Cortex-A8 and -A9, and Cortex-R4 cores equipped with ETM trace logic. IAR Systems In-circuit debugging probe deeplink